Optical in-circuit measurement system for immunity applications

Author

Chong Ding

Abstract

"During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. This thesis shows novel implementations of powering the laser, leading to a small, low cost optical probe"--Abstract, page iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

Drewniak, James L.
DuBroff, Richard E.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Publisher

University of Missouri--Rolla

Publication Date

Summer 2006

Pagination

ix, 53 pages

Note about bibliography

Includes bibliographical references (pages 51-52).

Rights

© 2006 Chong Ding, All rights reserved.

Document Type

Thesis - Restricted Access

File Type

text

Language

English

Subject Headings

Electrodynamics
Electromagnetic devices
Semiconductor lasers
Shielding (Electricity)

Thesis Number

T 9042

Print OCLC #

85893274

Link to Catalog Record

Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.

Recommended Citation

Ding, Chong, "Optical in-circuit measurement system for immunity applications" (2006). Masters Theses. 3977.
https://scholarsmine.mst.edu/masters_theses/3977