Investigation into a measurement-parameter-independent application of the modulated scatterer technique (MST) for material dielectric property characterization
Investigation into a measurement parameter independent application of the modulated scatterer technique (MST) for material dielectric property characterization
"The embedded modulated scatterer technique (MST) is a relatively new method for the determination of material dielectric properties by the combined use of near-field microwave nondestructive techniques and modulated scattering. This method involves using an open-ended rectangular waveguide to impinge an electric field on a modulated probe embedded in a dielectric material of interest. By analyzing the scattered signal, the dielectric properties of the material can be evaluated. The MST probe was modeled as a loaded dipole, and a forward model was established to simulate the interaction between the dipole probe and the waveguide radiator. In previous research investigations, measurement parameters such as the relative depth and orientation of the embedded probe were explicitly required for the evaluation of the material dielectric properties. The goal of this study was to investigate a means of determining the material dielectric properties independent of these measurement parameters"--Abstract, leaf iii.
DuBroff, Richard E.
Schwartz, Robert W.
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
xi, 126 leaves
© 2006 Gabriel Scott Freiburger, All rights reserved.
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Freiburger, Gabriel S., "Investigation into a measurement-parameter-independent application of the modulated scatterer technique (MST) for material dielectric property characterization" (2006). Masters Theses. 3842.