Masters Theses


Investigation into a measurement-parameter-independent application of the modulated scatterer technique (MST) for material dielectric property characterization

Alternative Title

Investigation into a measurement parameter independent application of the modulated scatterer technique (MST) for material dielectric property characterization


"The embedded modulated scatterer technique (MST) is a relatively new method for the determination of material dielectric properties by the combined use of near-field microwave nondestructive techniques and modulated scattering. This method involves using an open-ended rectangular waveguide to impinge an electric field on a modulated probe embedded in a dielectric material of interest. By analyzing the scattered signal, the dielectric properties of the material can be evaluated. The MST probe was modeled as a loaded dipole, and a forward model was established to simulate the interaction between the dipole probe and the waveguide radiator. In previous research investigations, measurement parameters such as the relative depth and orientation of the embedded probe were explicitly required for the evaluation of the material dielectric properties. The goal of this study was to investigate a means of determining the material dielectric properties independent of these measurement parameters"--Abstract, leaf iii.


Zoughi, R.

Committee Member(s)

DuBroff, Richard E.
Schwartz, Robert W.


Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering


University of Missouri--Rolla

Publication Date

Spring 2006


xi, 126 leaves


© 2006 Gabriel Scott Freiburger, All rights reserved.

Document Type

Thesis - Citation

File Type




Library of Congress Subject Headings

Microwave measurements
Modulation (Electronics)
Nondestructive testing

Thesis Number

T 8927

Print OCLC #


Link to Catalog Record

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