Optimization of capacitor structures for improved fault tolerance and reliability
"Evidence has shown that many capacitor failures can be attributed to field enhancement that occurs on the tips of electrodes within a multi-layer ceramic capacitor. This field enhancement is caused by an increased charge density at these points. In this research, a method to minimize the field enhancement is derived. Specifically, the resistivity in the dielectric region surrounding the tips is modified to allow charge on the conductor to distribute over a wide region. The optimal resistivity profile has been derived numerically through the combined use of finite element analysis and genetic algorithms. Designs resulting from the optimization are compared to a baseline multi-layer ceramic capacitor. It is shown that the field enhancement is nearly eliminated using relatively small changes in the resistivity of the dielectric."--Abstract, leaf iii.
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
vii, 73 leaves
© 2004 Bradley John Deken, All rights reserved.
Thesis - Citation
Library of Congress Subject Headings
Capacitors -- Testing
Ceramic capacitors -- Testing
Integrated circuits -- Fault tolerance
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b5283721~S5
Deken, Bradley John, "Optimization of capacitor structures for improved fault tolerance and reliability" (2004). Masters Theses. 2646.
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