Masters Theses

Title

Optimization of capacitor structures for improved fault tolerance and reliability

Abstract

"Evidence has shown that many capacitor failures can be attributed to field enhancement that occurs on the tips of electrodes within a multi-layer ceramic capacitor. This field enhancement is caused by an increased charge density at these points. In this research, a method to minimize the field enhancement is derived. Specifically, the resistivity in the dielectric region surrounding the tips is modified to allow charge on the conductor to distribute over a wide region. The optimal resistivity profile has been derived numerically through the combined use of finite element analysis and genetic algorithms. Designs resulting from the optimization are compared to a baseline multi-layer ceramic capacitor. It is shown that the field enhancement is nearly eliminated using relatively small changes in the resistivity of the dielectric."--Abstract, leaf iii.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Summer 2004

Pagination

vii, 73 leaves

Note about bibliography

Includes bibliographical references (leaf 115).

Rights

© 2004 Bradley John Deken, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Library of Congress Subject Headings

Capacitors -- Testing
Ceramic capacitors -- Testing
Integrated circuits -- Fault tolerance
Fault-tolerant computing

Thesis Number

T 8578

Print OCLC #

58398218

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b5283721~S5

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