Development of the embedded modulated scattering technique for dielectric material characterization

Author

Dana Hughes

Abstract

"This study investigates the use of combining an embedded modulated scattering technique, utilizing a PIN diode-loaded dipole (i.e., MST) probe, with traditional near-field microwave nondestructive testing techniques, utilizing open-ended rectangular waveguide probes, for determination of the dielectric properties of a material."--Abstract, page ii.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Spring 2003

Pagination

xviii, 268 pages

Rights

© 2003 Dana T. Hughes, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Subject Headings

Dielectrics
Modulation (Electronics)
Nondestructive testing

Thesis Number

T 8259

Print OCLC #

53227931

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

Recommended Citation

Hughes, Dana, "Development of the embedded modulated scattering technique for dielectric material characterization" (2003). Masters Theses. 2327.
https://scholarsmine.mst.edu/masters_theses/2327