Masters Theses

Title

Development of the embedded modulated scattering technique for dielectric material characterization

Author

Dana Hughes

Abstract

"This study investigates the use of combining an embedded modulated scattering technique, utilizing a PIN diode-loaded dipole (i.e., MST) probe, with traditional near-field microwave nondestructive testing techniques, utilizing open-ended rectangular waveguide probes, for determination of the dielectric properties of a material."--Abstract, page ii.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Spring 2003

Pagination

xviii, 268 pages

Note about bibliography

Includes bibliographical references (leaf 101).

Rights

© 2003 Dana T. Hughes, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Library of Congress Subject Headings

Dielectrics
Modulation (Electronics)
Nondestructive testing

Thesis Number

T 8259

Print OCLC #

53227931

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b5004082~S5

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