Masters Theses

Author

Amendra Koul

Abstract

"Analysis of printed circuit board (PCB) behavior in a wide frequency range from tens MHz to at least 40 GHz is very important for modern high-speed digital design and assuring for signal integrity (SI). this analysis includes preliminary evaluation of per-unit-length parameters of the PCB transmission line and transmission line characteristics, such as propagation and attenuation constants, and also extraction of these parameters from measurements on real test vehicles. This thesis describes an impedance calculator tool, which can substantially speed up PCB design, and the second topic considered in this work is characterization of dielectric parameters of substrates of printed circuit boards. The latter includes study of the effect of conductor surface roughness on the extracted material parameters of dielectrics. A new method to separate conductor loss from dielectric loss in rough PCB's is proposed"--Abstract, page iv.

Advisor(s)

Koledintseva, Marina

Committee Member(s)

Fan, Jun, 1971-
Drewniak, James L.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Summer 2010

Journal article titles appearing in thesis/dissertation

  • Developing an SI toolset for engineering design discovery, physical insight, and education
  • Improved technique for extracting parameters of low-loss dielectrics on printed circuit boards
  • Differential method for separating dielectric and rough conductor losses in printed circuit boards

Pagination

x, 72 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2010 Amendra Koul, All rights reserved.

Document Type

Thesis - Restricted Access

File Type

text

Language

English

Library of Congress Subject Headings

Dielectrics
Printed circuits -- Testing
Signal integrity (Electronics)

Thesis Number

T 9675

Print OCLC #

690920505

Electronic OCLC #

911201590

Link to Catalog Record

Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b8075731~S5

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