A BIST Approach for Configurable Nanofabric Arrays
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Abstract
This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
This paper has been withdrawn.
