Experimental and FDTD Study of the EMI Performance of an Open-Pin-Field Connector for Modules-on-Backplanes

Xiaoning Ye
J. Nadolny
James L. Drewniak, Missouri University of Science and Technology
Richard E. DuBroff, Missouri University of Science and Technology
Todd H. Hubing, Missouri University of Science and Technology
Thomas Van Doren, Missouri University of Science and Technology

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1035

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Abstract

Experimental measurements and numerical modeling were used to study the EMI performance of a module-on-backplane connector for various configurations of signal-return pin-outs. A commercially available open-pin-field connector was used in these results to connect between the mother-board and the daughter-card. The experimental techniques, based on measuring |S 21 |, included both common-mode current measurements and monopole near-field probe measurements. The FDTD method was used to provide numerical support of the near-field measurements and generally agreed with the measured results for frequencies up to 3 GHz. The FDTD method was also used to investigate the relationship between the radiated EMI at 3 m and the connector pin-out configurations