Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.
J. Lai et al., "Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor Through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe," Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, 2004. IMTC '04, Institute of Electrical and Electronics Engineers (IEEE), Jan 2004.
The definitive version is available at http://dx.doi.org/10.1109/IMTC.2004.1350994
21st IEEE Instrumentation and Measurement Technology Conference, 2004. IMTC '04
Electrical and Computer Engineering
Keywords and Phrases
Coatings; Coaxial Cables; Coaxial Probes; Composites; Conductor; Dielectric Constant; Dielectric Materials; Dielectric Properties; Dielectric Slab Thickness; Electromagnetic Wave Reflection; Free-Space; Material Properties; Microwave Measurement; Microwave Nondestructive Testing; Microwaves; Nondestructive Testing; Open-Ended Rectangular Waveguide; Probes; Rectangular Waveguide Probe; Rectangular Waveguides; Reflection Coefficient Inversion; Thickness Measurement
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