Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.

Meeting Name

21st IEEE Instrumentation and Measurement Technology Conference, 2004. IMTC '04


Electrical and Computer Engineering

Keywords and Phrases

Coatings; Coaxial Cables; Coaxial Probes; Composites; Conductor; Dielectric Constant; Dielectric Materials; Dielectric Properties; Dielectric Slab Thickness; Electromagnetic Wave Reflection; Free-Space; Material Properties; Microwave Measurement; Microwave Nondestructive Testing; Microwaves; Nondestructive Testing; Open-Ended Rectangular Waveguide; Probes; Rectangular Waveguide Probe; Rectangular Waveguides; Reflection Coefficient Inversion; Thickness Measurement

International Standard Serial Number (ISSN)


Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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