Microwave characterization methods are effective means for evaluating dielectric properties of materials and correlating them to their important physical, chemical and mechanical properties. For characterization purposes most materials are considered homogeneous and the measurement of their dielectric properties is fairly straightforward. However, certain materials may be considered inhomogeneous in such a way that their dielectric properties vary in a preferred direction within the material. To evaluate the dielectric property profile of these materials an electromagnetic model is necessary that can be used along with their measured reflection and transmission properties. This paper presents the development of such a model which is subsequently used to determine the dielectric property profile in mortar samples exposed to cyclical ingress of salt solution.
R. Zoughi et al., "Determination of Dielectric Property Profile in Cement-Based Materials using Microwave Reflection and Transmission Properties," Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, 2004. IMTC '04, Institute of Electrical and Electronics Engineers (IEEE), Jan 2004.
The definitive version is available at http://dx.doi.org/10.1109/IMTC.2004.1351056
21st IEEE Instrumentation and Measurement Technology Conference, 2004. IMTC '04
Electrical and Computer Engineering
Keywords and Phrases
Cement-Based Materials; Cements (Building Materials); Chemical Properties; Cyclical Ingress; Dielectric Measurement; Dielectric Properties; Dielectric Property Profile Determination; Electromagnetic Model; Electromagnetic Wave Reflection; Electromagnetic Wave Transmission; Homogeneous Materials; Mechanical Properties; Microwave Characterization Methods; Microwave Dielectric Characterization; Microwave Measurement; Microwave Reflection; Microwave Transmission; Mortar Samples; Physical Properties; Salt Solution
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.