Abstract

Some faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

CMOS Integrated Circuits; Asynchronous Sequential Logic; Behavioural Level; Circuit Faults; Combinational Behaviour; Combinatorial Circuits; Data-Feedthrough Faults; Logic Testing; Semiconductor Storage; Stuck-At Faults; Stuck-At-0/1 Faults; Unclocked Storage Elements

International Standard Serial Number (ISSN)

0013-5194

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 1994 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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