## Electrical and Computer Engineering Faculty Research & Creative Works

#### Abstract

The common-mode (CM) current due to a trace near a printed circuit board (PCB) edge, and its suppression by a guard band have been studied experimentally and with finite-difference time-domain (FDTD) modeling. As the guard band, copper tape is connected along the entire edge of the ground plane. First, a PCB electromagnetic interference (EMI) coupling path that results from the nonzero impedance of the PCB ground plane is discussed. As the trace is moved closer to the PCB edge, the CM current increases. Then, the effect of the guard band on the CM current is detailed. A guard band parallel to and near a trace is most effective in suppressing the CM current. The cross-sectional magnetic Held distribution at center of the PCB with and without the guard band is also calculated with FDTD modeling. The guard band decreases the magnetic field distributed on the reverse side of a PCB. These results indicate the guard band is effective in suppressing CM current. Finally, an empirical formula to quantify the relationship between the position of a trace and CM current for the case with a guard band is proposed. Calculated results using the empirical formula and FDTD modeling are in good agreement, which indicates this empirical formula should be useful for developing EMI design guidelines.

#### Department(s)

Electrical and Computer Engineering

#### Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

#### Keywords and Phrases

Common-Mode (CM) Current; Copper Tape; Cross-Sectional Magnetic Field Distribution; Current Suppression; Electric Current; Electromagnetic Interference (EMI); Finite Difference Time-Domain Method (FDTD); Guard Band; Magnetic Fields; Printed Circuit Board (PCB); Electric Currents; Electromagnetic Compatibility; Equivalent Circuits; Finite Difference Method; Interference Suppression; Magnetic Field Effects; Mathematical Models; Time Domain Analysis; Empirical Formula; Printed Circuit Boards

#### International Standard Serial Number (ISSN)

0018-9375; 1558-187X

#### Document Type

Article - Journal

Final Version

text

English