Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
G. Muchaidze et al., "Automated Near-Field Scanning to Identify Resonances," Proceedings of the 2008 International Symposium on Electromagnetic Compatibility - EMC Europe, Institute of Electrical and Electronics Engineers (IEEE), Sep 2008.
The definitive version is available at http://dx.doi.org/10.1109/EMCEUROPE.2008.4786897
2008 International Symposium on Electromagnetic Compatibility - EMC Europe
Electrical and Computer Engineering
Materials Science and Engineering
Keywords and Phrases
EMI; ESD; Near Field Scanning
Library of Congress Subject Headings
Article - Conference proceedings
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.