Abstract

Investigation into the derivation of the dielectric property of a material with an embedded modulated PIN diode-loaded dipole is described, using an open-ended rectangular waveguide as the irradiating source. Previous measurements of the curing of a mortar specimen show the sensitivity of this combined technique and its potential for inspecting composite structures. Modification of previous algorithms for back calculating the dielectric properties of a material with a conductor backing is considered. The modification would involve replacing the reflection at the conductor with the reflection at a modulated dipole antenna. For this, comparisons between the reflection coefficients of the dipole antenna and an infinite conducting plate are made. These results are analyzed, and the necessary considerations are discussed.

Meeting Name

18th IEEE Instrumentation and Measurement Technology Conference, 2001. IMTC 2001

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Composite Materials; Composites; Conductor Backing; Dielectric Measurement; Dielectric Properties; Electromagnetic Wave Scattering; Embedded Modulated PIN Diode-Loaded Dipole; Embedded Modulated Scattering; Microwave Measurement; Microwave Nondestructive Testing; Near-Field Microwave NDT Technique; Nondestructive Testing; Open-Ended Rectangular Waveguide; Reflection Coefficients; Sensitivity

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2001 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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