Abstract

This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.

Meeting Name

8th IEEE Conference on Nanotechnology, 2008. NANO'08

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

BIST; Crossbar Architecture; Defects; Nanofabrics; Recovery; Redundancy

Library of Congress Subject Headings

Nanowires

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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