This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
M. V. Joshi and W. K. Al-Assadi, "A BIST Approach for Configurable Nanofabric Arrays," Proceedings of the 8th IEEE Conference on Nanotechnology, 2008. NANO'08, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at http://dx.doi.org/10.1109/NANO.2008.210
8th IEEE Conference on Nanotechnology, 2008. NANO'08
Electrical and Computer Engineering
Keywords and Phrases
BIST; Crossbar Architecture; Defects; Nanofabrics; Recovery; Redundancy
Library of Congress Subject Headings
Article - Conference proceedings
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.