Abstract
System level ESD tests can only be performed after hardware is available. Simulating the ESD coupling into a circuit allows at least parametric and quantitative studies of the expected ESD behavior. A complete simulation requires us to model the ESD generator, the passive elements of the DUT and the response of the ICs to injected noise. Having the ultimate objective of combining IC soft error response models with the DUT structure and the ESD generator we report on progresses in modeling the ESD generator and its coupling. The model improves the useful frequency range from a few hundred MHz to about 3 GHz.
Recommended Citation
Q. Cai et al., "Advanced Full Wave ESD Generator Model for System Level Coupling Simulation," Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at https://doi.org/10.1109/ISEMC.2008.4652137
Meeting Name
2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electrostatic Discharge; Numerical Modeling
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2008
