Microwave Thickness Measurement of Lossy Layered Dielectric Slabs using Incoherent Reflectivity

Author

Sasan Bakhtiari
R. Zoughi, Missouri University of Science and TechnologyFollow

Abstract

Radiative transfer theory is used to calculate the incoherent effective reflectivity (Γ_e) for a multilayer lossy dielectric medium backed by a conducting plate. The theoretical results of this formulation are compared with that of the coherent approach. Several test cases are presented to show the characteristics of Γ_e as a function of thickness, and dielectric constant of the dielectric layers, and frequency. The results can ultimately be used in nondestructive dielectric thickness measurement.

Recommended Citation

S. Bakhtiari and R. Zoughi, "Microwave Thickness Measurement of Lossy Layered Dielectric Slabs using Incoherent Reflectivity," Research in Nondestructive Evaluation, vol. 2, no. 3, pp. 157 - 168, Taylor & Francis, Sep 1990.

The definitive version is available at https://doi.org/10.1080/09349849009409495

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Lossy Dielectric; Composite Testing And Evaluation; Electromagnetic Formulation-Probe Development And Antennas

International Standard Serial Number (ISSN)

0934-9847

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1990 Taylor & Francis, All rights reserved.

Publication Date

01 Sep 1990