Cost-Driven Repair Optimization of Reconfigurable Nanowire Crossbar Systems with Clustered Defects

Abstract

With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect tolerance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations. Then, costs associated with the repair process are analyzed and a method to find the most cost-effective repair solution is presented.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Clustered Defects; Cost-Driven Optimization; Crossbar Architecture; Defect Tolerance (FT); Logic Mapping; Reconfiguration; Nanoelectronics; Conformal Mapping; Cost Effectiveness; Electric Wire; Maintenance; Nanostructured Materials; Nanostructures; Nanowires; Repair; Assembly Techniques; Building Blocks; Configurability; Elsevier (CO); High Density Systems; High-Density; Nano Scale Materials; Nano Wires; Nano-Meter-Scale; Parametric Simulations; Re Configurable Architecture; Re-Configurable; Recent Development; Reconfigurable Systems; Repair Processes; Repair Solution; Defect Density

International Standard Serial Number (ISSN)

1383-7621

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2008 Elsevier, All rights reserved.

Publication Date

01 Aug 2008

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