Abstract
The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.
Recommended Citation
S. Scafati et al., "Single Step 2-Port Device De-Embedding Algorithm for Fixture-Dut-Fixture Network Assembly," Electronics (Switzerland), vol. 10, no. 11, article no. 1275, MDPI, Jun 2021.
The definitive version is available at https://doi.org/10.3390/electronics10111275
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
2-Port Networks; De-Embedding; Measurement Setup; S-Parameters
International Standard Serial Number (ISSN)
2079-9292
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2021 The Authors, All rights reserved.
Publication Date
01 Jun 2021
