Active Probes for Creating H-Field Probes for Flat Frequency Response

Abstract

This paper presents an approach to obtain a flat frequency response from the first order derivative behavior of an electrically small loop and electrically short electric field probe by using them in combination with active oscilloscope probes. An H-field probe made in flex circuit technology was designed to operate up to about 5 GHz. These probes have loop dimensions as small as 3 × 3 mil and trace widths in the order of 1.75 mils. The H-field probe terminals are connected to the differential amplifier of the active oscilloscope probe which functions as an integrator to achieve a flat frequency response. The integrator behavior compensates for the first order derivative response of the flex circuit probes. The E-field probe utilizes the high input impedance of the browser attached to the active probe for achieving a flat frequency response.

Meeting Name

IEEE International Symposium on Electromagnetic Compatbility (2009: Aug. 17-21, Austin, TX)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Active Probe; E-Field; First Order Derivatives; Flat Frequency Response; Flex Circuits; High Input Impedance; Cathode Ray Oscilloscopes; Differential Amplifiers; Electric Fields; Electric Impedance; Electromagnetic Compatibility; Integrated Circuits; Oscillographs; Plastic Molds; Probes; Ultrasonic Devices; Frequency Response; Flexible Electronics; Oscilloscopes; Radio Frequency; Coupling Circuits; Connectors; Frequency Conversion; Circuit Testing; Flex Circuit Technology; Active Probes; H-Field Probes; First Order Derivative Behavior; Electrically Short Electric Field Probe; E-Dot Sensor; H-Dot Sensor; Integrator; Derivative

International Standard Book Number (ISBN)

978-1424442669

International Standard Serial Number (ISSN)

2158-110X; 2158-1118

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2009

Link to Full Text

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