Abstract
Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
Recommended Citation
M. T. Ghasr et al., "Microwave Reflectometry for Physical Inspections," U.S. Patents, Jul 2019.
Department(s)
Electrical and Computer Engineering
Patent Application Number
US16/326,529
Patent Number
US20190227003A1
Document Type
Patent
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2017 The Curators of the University of Missouri, All rights reserved.
Publication Date
25 Jul 2019
