Title

Near-Field Scanning for EM Emission Characterization

Abstract

This tutorial reviews a few important issues when using the near-field scanning technique for EM emission characterization. Calibration of field probes is introduced first to eliminate or reduce the errors in the measurement of EM field components. Then, methodologies to obtain the phase information in near-field scanning are discussed. For characterizing radiators in free space in terms of far-field emissions, different Near-Field Far-Field Transformation algorithms are introduced. Finally, radiated-emission models based on near-field scanning are presented for characterizing the radiators in a complex environment/system, and an example on interference estimation demonstrates the application of such models.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Sponsor(s)

National Science Foundation (U.S.)

Comments

Part of the related research was supported by the National Science Foundation (NSF) under Grant 0855878.

Keywords and Phrases

Calibration; Electromagnetic compatibility; Magnetic domains; Phase measurement; Probes; Radiators; Scanning; Testing; Complex environments; Emission characterization; Field probes; Interference estimation; Near-field far-field transformation; Near-field scanning; Phase information; Radiated emissions; Magnetic field measurement

International Standard Serial Number (ISSN)

2162-2264; 2162-2272

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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