Near-Field Scanning for EM Emission Characterization
Abstract
This tutorial reviews a few important issues when using the near-field scanning technique for EM emission characterization. Calibration of field probes is introduced first to eliminate or reduce the errors in the measurement of EM field components. Then, methodologies to obtain the phase information in near-field scanning are discussed. For characterizing radiators in free space in terms of far-field emissions, different Near-Field Far-Field Transformation algorithms are introduced. Finally, radiated-emission models based on near-field scanning are presented for characterizing the radiators in a complex environment/system, and an example on interference estimation demonstrates the application of such models.
Recommended Citation
J. Fan, "Near-Field Scanning for EM Emission Characterization," IEEE Electromagnetic Compatibility Magazine, vol. 4, no. 3, pp. 67 - 73, Institute of Electrical and Electronics Engineers (IEEE), Nov 2015.
The definitive version is available at https://doi.org/10.1109/MEMC.2015.7336759
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Sponsor(s)
National Science Foundation (U.S.)
Keywords and Phrases
Calibration; Electromagnetic compatibility; Magnetic domains; Phase measurement; Probes; Radiators; Scanning; Testing; Complex environments; Emission characterization; Field probes; Interference estimation; Near-field far-field transformation; Near-field scanning; Phase information; Radiated emissions; Magnetic field measurement
International Standard Serial Number (ISSN)
2162-2264; 2162-2272
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Nov 2015
Comments
Part of the related research was supported by the National Science Foundation (NSF) under Grant 0855878.