Title

Modeling and Measurement of Ground Bounce Induced by High-Speed Output Buffer with On-Chip Low-Dropout (LDO) Regulator

Abstract

This study proposes a model of ground bounce induced by a high-speed output buffer with on-chip low-dropout (LDO) regulator. When the output buffer operates with a high-speed clock, high output impedance of the pass transistor and low impedance of the on-chip decoupling capacitor at load enable the ground bounce calculation by only using the self-impedance of the off-chip ground network and switching current spectra. The accuracy of the proposed model is indirectly validated by measurement. Simulated ground bounce by using the proposed model shows very good correlation with the experimentally validated SPICE model.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Sponsor(s)

National Science Foundation (U.S.)

Comments

This work was supported in part by the National Science Foundation under Grant IIP-1440110.

Keywords and Phrases

Electric current regulators; Good correlations; Ground bounce; Low-dropout regulators; Modeling and measurement; On-chip Decoupling capacitors; Output Buffer; Pass transistors; Switching currents; SPICE; High-speed output buffer; On-chip low-dropout (LDO) regulator

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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