Title

Error Bounds Analysis of De-Embedded Results in 2x thru De-Embedding Methods

Abstract

In this paper, an error bound analysis is performed for 2x thru de-embedding methods: AFR (Automatic Fixture Removal) and SFD (Smart Fixture De-embedding). Basically, a certain amount of error is assumed to exist in S11 of 1x. This error will cause the de-embedded results to vary within a certain range. The upper bound and lower bound of the magnitude of the de-embedded results are given.

Meeting Name

2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI (2017: Aug. 7-11, Washington, DC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Sponsor(s)

National Science Foundation (U.S.)

Comments

This paper is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.

Keywords and Phrases

Electromagnetic compatibility; Error analysis; Fixtures (tooling); De-embedding; De-embedding method; Error bound; Fixture removals; Lower bounds; Upper Bound; Errors; AFR; SFD

International Standard Book Number (ISBN)

978-1-5386-2229-2

International Standard Serial Number (ISSN)

2158-1118

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Share

 
COinS