Title

De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD

Abstract

The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.

Meeting Name

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC (2018: May 14-18, Singapore, Singapore)

Department(s)

Electrical and Computer Engineering

Sponsor(s)

National Science Foundation (U.S.)

Comments

This paper is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.

Keywords and Phrases

1-PortAFR; 2X-Thru SFD; De-embedding; Full-wave model; LX-Reflect SFD; USB-C

International Standard Book Number (ISBN)

978-1-5090-3955-5

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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