Title

A BIST Technique for Configurable Nanofabric Arrays

Abstract

This work proposes a built-in self test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Built-In Self Test; Logic Testing; Nanoelectronics; Programmable Circuits

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.


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