A BIST Technique for Configurable Nanofabric Arrays

Author

Waleed K. Al-Assadi, Missouri University of Science and TechnologyFollow
Mandar V. Joshi
Ghulam M. Chaudhry

Abstract

This work proposes a built-in self test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.

Recommended Citation

W. K. Al-Assadi et al., "A BIST Technique for Configurable Nanofabric Arrays," International Workshop on Design and Test of Nano Devices, Circuits and Systems, Institute of Electrical and Electronics Engineers (IEEE), Sep 2008.

The definitive version is available at https://doi.org/10.1109/NDCS.2008.8

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Built-In Self Test; Logic Testing; Nanoelectronics; Programmable Circuits

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2008