The Importance of the Fundamentals
Abstract
When Simona asked me to contribute an article to her regular I&M Magazine column, I was immediately honored that she believed I had something worthy to contribute and then immediately nervous -- “What will I say?” As I thought about it, wondering what my own future trends are and will be as I proceed in my own academic career, the same concept kept coming back to me: fundamentals, fundamentals, and fundamentals. When I am not teaching as an Assistant Professor at Missouri University of Science and Technology, much of my time is spent writing proposals, oftentimes submitting to agencies that emphasize fundamental science. The other side of the academic paradigm focuses on applied science and engineering (which will never happen without a solid scientific and fundamental basis). So, as you can imagine, the fundamentals provide an important and critical footing upon which everything I do is built.
Recommended Citation
K. M. Donnell, "The Importance of the Fundamentals," IEEE Instrumentation and Measurement Magazine, vol. 18, no. 4, pp. 51 - 52, Institute of Electrical and Electronics Engineers (IEEE), Aug 2015.
The definitive version is available at https://doi.org/10.1109/MIM.2015.7155775
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Education, Electromagnetic near fields; Future trends; Instrumentation and measurements; Materials evaluation; Missouris; Science and Technology; Young engineer, Teaching
International Standard Serial Number (ISSN)
1094-6969
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2015
Comments
Guest author for the column on Future Trends in I&M: "Dear Readers, This time, our guest author for the column on Future Trends in I&M is Kristen M. Donnell. Kristen is indeed a brilliant woman, who works hard with delight and passion. This is also confirmed by all of the awards she has received: Missouri University of Science and Technology 2014 Faculty Teaching Award; IEEE Instrumentation and Measurement Society 2012 Outstanding Young Engineer Award; Teaching Commendation for 2012-2013 Academic Year; Outstanding Teaching Award for 2011-2012 Academic Year; the ASNT Fellowship Award for the 2002-2003 and 2006-2007 academic years; the Missouri S&T Chancellors Fellowship for 2006-2009; and the Missouri S&T University Transportation Center Graduate Fellowship for 2006. She also received the Materials Evaluation Best Paper Award in 2005 and placed first in the student poster contest at Third International Conference on Electromagnetic Near-Field Characterization and Imaging in 2007. I'm sure you will like her nice contribution. Best wishes, Simona."