Need for Undergraduate and Graduate-Level Education in Testing of Microelectronic Circuits and Systems
Abstract
As deep-sub-micron and beyond technology emerges, quality assurance of microelectronic circuits and systems becomes more important than ever. Consequentially, (1) a strong need for well-educated microelectronic circuits and systems test engineers is desired by the industry, (2) graduate-level research efforts are also called to overcome numerous microelectronic circuits and systems test issues. This paper is to address issues related to increasing impact of the electronic circuits and systems test field on education in electrical and computer engineering and to propose suitable educational topics for undergraduate and graduate-level electrical and computer engineering courses.
Recommended Citation
M. Choi et al., "Need for Undergraduate and Graduate-Level Education in Testing of Microelectronic Circuits and Systems," Proceedings of the IEEE International Conference on Microelectronic Systems Education (2003, Anaheim, CA), pp. 121 - 122, IEEE Computer Society, Jun 2003.
The definitive version is available at https://doi.org/10.1109/MSE.2003.1205283
Meeting Name
IEEE International Conference on Microelectronic Systems Education (2003: Jun. 1-2, Anaheim, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Microelectronics; Quality Assurance; Circuits and Systems; Deep Sub-Micron; Electrical and Computer Engineering; Graduate Levels; Microelectronic Circuits; Research Efforts; Test Engineers; Test Fields; Education
International Standard Book Number (ISBN)
978-0769519739
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2003 IEEE Computer Society, All rights reserved.
Publication Date
01 Jun 2003
