A Novel Technique to Minimize Standby Leakage Power in Nanoscale CMOS VLSI

Abstract

This paper proposes a novel approach to minimize leakage currents in CMOS circuits during the off-state (or standby mode, sleep mode) by applying the optimal reverse body bias to the substrate (body or bulk) to increase the threshold voltage of transistors. The optimal bias point is determined by comparing the sub-threshold current (ISUB) and band-to-band current (IBTBT) simultaneously. The proposed circuit was simulated in HSPICE using 32nm bulk CMOS technology and evaluated using ISCAS85 benchmark circuits at different operating temperature (ranging from 25°C to 100°C). Analysis of the results shows a maximum of 551 and 1491 times leakage power reduction at 25°C and 100°C on a circuit with 546 gates. The proposed approach demonstrates that the optimal body bias reduces considerable amount of the leakage power in the nanoscale CMOS integrated circuits. In this approach, the temperature and supply voltage variations are compensated by the proposed feedback loop.

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference: I2MTC (2009: May 5-7, Singapore)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Band to Band Tunneling; Band-to-Band Tunneling (BTBT) Leakage Current; SLEEP Mode; Standby Mode; Sub-Threshold Leakage; CMOS Integrated Circuits; Electric Network Analysis; Integrated Circuits; Measurement Theory; MOS Capacitors; Nanostructured Materials; Optimization; Sleep Research; Tunneling (Excavation); Wind Tunnels; Leakage Currents; Off-State; Sub-Threshold Leakage Current

International Standard Book Number (ISBN)

978-1424433520

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2009

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