Title

TILAS: A Simple Analysis Tool for Estimating Power Losses in an IGBT-Diode Pair under Hysteresis Control in Three-Phase Inverters

Abstract

Several techniques for analyzing and estimating power losses in insulated-gate bipolar transistors (IGBTs), diodes, MOSFETs, and other power electronics switching devices are known. Most of the approaches in the literature deal with periodic pulse width modulation (PWM) switching schemes. This paper presents a simple analysis tool to estimate these losses under aperiodic switching schemes, e.g. hysteresis. The tool aims to simplify such an analysis with two main measurements-the load current of a converter phase leg and the gate switching waveform of the upper IGBT of that phase. No model estimations, thermal analyses, or slow simulations are required. Consistency between results from the proposed tool and a commercially available tool designed by an IGBT manufacturer is shown. A periodic frequency is proposed to adapt available software used with periodic switching schemes to aperiodic switching schemes. Experimental tests from an inverter application are presented here.

Meeting Name

24th Annual IEEE Applied Power Electronics Conference and Exposition (2009: Feb. 15-19, Washington, DC)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Analysis Tools; Converter Losses; Diode Pairs; Experimental Test; Gate Switching; Hysteresis Control; Insulated Gate; Inverter Application; Load Currents; Loss Estimation Technique; Model Estimation; MOSFETs; Periodic Pulse; Periodic Switching; Power-Losses; Switching Devices; Switching Scheme; Terms-IGBT Losses; Thermal Analysis; Three-Phase Inverter; Active Filters; Bipolar Transistors; Electric Power Supplies To Apparatus; Hysteresis; Insulated Gate Bipolar Transistors (IGBT); Power Electronics; Pulse Width Modulation; Switching; Thermoanalysis; Estimation

International Standard Book Number (ISBN)

9781424428113

International Standard Serial Number (ISSN)

1048-2334

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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