Title

Stressed Jitter Analysis for Physical Link Characterization

Abstract

A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2010: Jul. 25-30, Fort Lauderdale, FL)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Device Selection; Frequency Domains; Jitter Analysis; Path Analysis; Path Optimizations; Practical Engineering; S-Parameters; Electromagnetic Compatibility; Electromagnetism; Frequency Domain Analysis; Regression Analysis; Scattering Parameters; Jitter; Histograms; Noise; Mathematical Model; Signal Analysis; Bit Error Rate; Receivers; Design Engineering; Interference (Signal); Device Qualification; Stressed Jitter Analysis; Physical Link Characterization; Link-Path Analysis; Frequency-Domain S-Parameter; Stressed Link Path Analysis; Engineering Design; Link Path Optimization

International Standard Book Number (ISBN)

9781424463053; 9781424463084

International Standard Serial Number (ISSN)

2158-1118; 2158-110X

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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