Finding the Root Cause of an ESD Upset Event
System level Electrostatic Discharges (ESD) can lead to soft-errors (e.g., bit-errors, wrong resets etc.). By this talk we try to offer guidance in finding the root cause of upsets frequently observed in immunity testing (e.g., ESD, EFT). At first a description of the ESD discharge process is given. It provides the necessary background for correctly analyzing ESD failures. Local scanning and in-circuit measurement techniques are explained. Further, it is shown how PCB scanning results, revealing local sensitivities, can be used for the characterization and optimization of circuit and ICs design and software for minimizing unwanted responses to soft-error causing noise. A series of measurements of such noise voltages coupled into a sensitive trace are presented.
D. Pommerenke et al., "Finding the Root Cause of an ESD Upset Event," Proceedings of DesignCon 2006 (2006, Santa Clara, CA), International Engineering Consortium, Feb 2006.
DesignCon 2006 (2006: Feb. 6-9, Santa Clara, CA)
Electrical and Computer Engineering
Keywords and Phrases
ESD; Electrostatic Discharges
Library of Congress Subject Headings
Article - Conference proceedings
© 2006 International Engineering Consortium, All rights reserved.