Title

Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network

Abstract

Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Sponsor(s)

National Science Foundation (U.S.)
Ulsan National Institute of Science and Technology

Comments

This work was jointly supported by the National Science Foundation under Grant 0855878, and the year of 2011 Research Fund of the Ulsan National Institute of Science and Technology, Korea.

Keywords and Phrases

Bulk Capacitors; Closed-Form Expression; Consumer Devices; Decoupling Capacitor; Dynamic Noise; Power Distribution Network; Switching Currents; Transient Noise; Voltage Noise; Capacitors; Electric Current Measurement; Electric Network Analysis; Switching; Power Quality; Current Measurement; Design Guideline; Dynamic Noise; Power Distribution Network (PDN); Switching Current; Target Impedance

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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