Title

Methods for Speeding up Radiated and Conducted Immunity Tests

Abstract

Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Computer Hardware; Computer Software; Electric Machinery Testing; Pulse Circuits; Signal Processing; Time Domain Analysis; Immunity Tests; Sinusoidal Excitation; Electric Excitation

International Standard Book Number (ISBN)

0-7803-5677-2

International Standard Serial Number (ISSN)

0190-1494

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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