Comparison of Site-to-Site Measurement Reproducibility using UK National Physical Laboratory and Austrian Research Center Test Sites as a Reference
Twenty Radiated emission sites are compared using a sinusoidal reference transmitter in the frequency range of 30 to 1000 MHz. The data is referenced to results measured on the UK National Physical Laboratory and Austrian Research Centers reference sites. The data on nineteen site is reported in this article, the data on the one remaining was done at three meters and not comparable. Of the nineteen sites, nine performed from four to six measurements on different days and usually with different people. Statistically, the results of these nine sites show 95% of the measurements made were within +/-2.1 dB from the average of the reference sites. Test result differences in repeated EMC tests are partially caused by physical characteristics of the measurement sites and changes or differences in the measurement chain. This program has met the requirements of A2LA and NVLAP for site-to-site comparisons. Being programmable the source could be easily adaptable to "blind" proficiency assessments.
K. Hall et al., "Comparison of Site-to-Site Measurement Reproducibility using UK National Physical Laboratory and Austrian Research Center Test Sites as a Reference," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, DC), vol. 2, pp. 939-943, Institute of Electrical and Electronics Engineers (IEEE), Aug 2000.
The definitive version is available at http://dx.doi.org/10.1109/ISEMC.2000.874749
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Electrical and Computer Engineering
Keywords and Phrases
Electromagnetic Compatibility; Electromagnetic Waves; Statistical Methods; Transmitters; Radiated Emission Tests; Electromagnetic Field Measurement
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.