Measurement Methodology for Establishing an IC ESD Sensitivity Database
Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.
Z. Li et al., "Measurement Methodology for Establishing an IC ESD Sensitivity Database," Proceedings of the 2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010, Bejing, China), pp. 1051-1054, Institute of Electrical and Electronics Engineers (IEEE), Apr 2010.
The definitive version is available at http://dx.doi.org/10.1109/APEMC.2010.5475629
2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Coupled Problems; Electric Field and Magnetic Field; Electronic Device; Electronic Systems; Field Injection; Measurement Methodology; Soft Error; Transient Fields; Database Systems; Electric Fields; Electromagnetic Compatibility; Electromagnetism; Electrostatic Discharge; Magnetic Fields; Magnetic Materials; Electrostatic Devices
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International Standard Serial Number (ISSN)
Article - Conference proceedings
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