Title

Effects of TVS Integration on System Level ESD Robustness

Abstract

Higher integration of Transient Voltage Suppression (TVS) functionality into ASIC I/O cells implies lower system costs. But as the ESD pulse is directed deeper into the system, migrating the TVS clamping function from the periphery of the system to a central ASIC may actually reduce the system's ESD robustness. ESD current reconstruction scanning can be used to trace the current path on a PCB, and possibly within an IC. The article compares the current spreading during and ESD for different ESD protection methods.

Meeting Name

32nd Electrical Overstress/Electrostatic Discharge Symposium (2010: Oct. 3-8, Reno, NV)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Current Paths; Current Reconstruction; Current Spreading; ESD Protection; ESD Robustness; Higher Integration; System Costs; System-level ESD; Transient Voltage; Electric Power Supplies to Apparatus; Electrostatic Discharge; Polychlorinated Biphenyls; Electrostatic Devices

International Standard Book Number (ISBN)

1585371823; 9781585371822

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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