20V-High Speed Low Cost Arbitrary Waveform Generator for ICs Immunity Test

Abstract

A > 30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz - 6 GHz) power amplifier allowing > 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.

Meeting Name

2011 IEEE International Symposium on Electromagnetic Compatibility (2011: Aug. 14-19, Long Beach, CA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Arbitrary Waveform Generator; Bit Resolution; Higher Resolution; Immunity Test; Immunity Testing; Low Costs; Low Resolution; Power Amplification; RF Design; Sampling Rates; Wave Forms; Wide-band; Broadband Amplifiers; Electromagnetic Compatibility; Electromagnetism; Power Amplifiers; Transceivers; Waveform Analysis

International Standard Book Number (ISBN)

978-1-4577-0812-1

International Standard Serial Number (ISSN)

2158-110X

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2011

Link to Full Text

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