Title

A Study of a Measurement and Simulation Method on ESD Noise Causing Soft-Errors by Disturbing Signals

Abstract

A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling.

Meeting Name

33rd Electrical Overstress/Electrostatic Discharge Symposium (2011: Sep. 11-16, Anaheim, CA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

3D Simulations; Disturbing Signals; ESD Generator; Experimental Setup; IC Pins; Induced Noise; Measurement and Simulation; Soft Error; SPICE Modeling; Wave Forms; Electrostatic Discharge; Measurement Errors; SPICE; Three Dimensional; Three Dimensional Computer Graphics; Electrostatic Devices

International Standard Book Number (ISBN)

9781585371976; 978-1-58537-193-8

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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