Title

A Systematic Method for Determining Soft-Failure Robustness of a Subsystem

Abstract

A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.

Meeting Name

35th Electrical Overstress/Electrostatic Discharge Symposium (2013: Sep. 10-12, Las Vegas, NV)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Failure Thresholds; Mobile Phone Platforms; Root Cause; Systematic Method

International Standard Book Number (ISBN)

978-1-58537-232-4

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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