A Systematic Method for Determining Soft-Failure Robustness of a Subsystem
Abstract
A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.
Recommended Citation
B. Orr et al., "A Systematic Method for Determining Soft-Failure Robustness of a Subsystem," Proceedings of the 35th Electrical Overstress/Electrostatic Discharge Symposium (2013, Las Vegas, NV), Institute of Electrical and Electronics Engineers (IEEE), Aug 2013.
Meeting Name
35th Electrical Overstress/Electrostatic Discharge Symposium (2013: Sep. 10-12, Las Vegas, NV)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Failure Thresholds; Mobile Phone Platforms; Root Cause; Systematic Method
International Standard Book Number (ISBN)
978-1-58537-232-4
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2013
