A Simple Frequency Response Compensation Method for Current Probe Measurements of ESD Currents
The transfer impedance of a current probe is typically not constant within the current probe's operational frequency range. As it is based on induction, it will suffer from reduced sensitivity at lower frequencies. Thus, a current probe cannot be used directly in a time domain measurement. The low frequency roll-off of a current probe can severely distort the actual waveform. A simple frequency response compensation method is proposed here to enable ESD current measurements with current probes. The method enables a current probe to be used for time domain measurements, such as when measuring ESD transient current and estimating the total transferred charge. If a probe's datasheet provides the transfer impedance for the probe, no additional measurements are needed. Advantages and disadvantages of directly using the measured complex transfer impedance, instead of approximating the transfer impedance by a circuit, is discussed in this paper.
S. Yang et al., "A Simple Frequency Response Compensation Method for Current Probe Measurements of ESD Currents," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017, Washington, DC), pp. 158-163, Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077859
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017: Aug. 7-11, Washington, DC)
Electrical and Computer Engineering
Keywords and Phrases
Deconvolution; Electromagnetic Compatibility; Electrostatic Devices; Electrostatic Discharge; Frequency Response; Power Quality; Probes; Time Domain Analysis; Current Probe; Operational Frequency Range; Reduced Sensitivity; Response Compensation; Time Domain Measurement; Transfer Impedance; Transferred Charges; Transient Current; Transients; ESD Transient Current
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.