Title

Scenarios of ESD Discharges to USB Connectors

Abstract

Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.

Meeting Name

39th Electrical Overstress/Electrostatic Discharge Symposium (2017: Sep. 10-14, Tucson, AZ)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electrostatic Devices; Real-world Scenario; Stress Duration; Stress Voltages; Voltage Levels; Electrostatic Discharge

International Standard Book Number (ISBN)

978-1-58537-293-5

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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