Title

Characterizing ESD Stress Currents in Human Wearable Devices

Abstract

Currents induced on an I/O of a human wearable device IC are predicted using a test IC as a wearable device capable of transient event detection and level sensing. ESD on this pseudo wearable device using the test IC is characterized for different test scenarios and compared to the prediction.

Meeting Name

39th Electrical Overstress/Electrostatic Discharge Symposium (2017: Sep. 10-14, Tucson, AZ)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electrostatic Devices; Electrostatic Discharge; Integrated Circuits; ESD Stress; Level Sensing; Test Scenario; Transient Event Detection; Wearable Devices; Wearable Technology

International Standard Book Number (ISBN)

978-1-58537-293-5

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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