Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]
Abstract
On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTESTCON 2015. IEEE AUTOTESTCON is a unique event that brings together colleagues interested and involved in automated testing, product development and their users. This is also a wonderful venue for meeting new colleagues to learn about each other's products and initiate new collaborations. As in years past, we at the IEEE IMS are extremely happy to continue our support of IEEE AUTOTESTCON 2015 along with the IEEE Aerospace and Electronic Systems Society (AESS). These two societies share several common goals that make our mutual support of this event a must.
National Harbor, Maryland, USA and its proximity to Washington, D.C. with all that is offered in our nations' capital, is sure to make this an exciting and rewarding experience, both technically and culturally. On behalf of the Society, I wish for you to have a wonderful experience at the IEEE AUTOTESTCON 2015.
Recommended Citation
R. Zoughi and R. J. Lyons, "Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]," IEEE Instrumentation and Measurement Magazine, vol. 18, no. 4, p. 4, Institute of Electrical and Electronics Engineers (IEEE), Aug 2015.
The definitive version is available at https://doi.org/10.1109/MIM.2015.7155765
Meeting Name
IEEE AUTOTESTCON 2015 (2015: Nov. 2-5, National Harbor, MD)
Department(s)
Electrical and Computer Engineering
International Standard Serial Number (ISSN)
1094-6969; 1941-0123
Document Type
Remarks
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2015
