Title

Welcome to IEEE AUTOTEST 2014 [President's Perspectives]

Abstract

On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTEST 2014, being held in St. Louis, Missouri, USA, where it all started a half century ago. IEEE AUTOTEST is the focal event that brings those interested and involved in automated testing, product development, and ultimate users together under one roof. Events such as IEEE AUTOTEST are where people with the same interests and goals get together to discuss, learn, become aware of new technologies and ultimately collaborate. We are extremely happy to continue our support of IEEE AUTOTEST 2014 along with the IEEE Aerospace and Electronic Systems Society (AESS).

Meeting Name

IEEE AUTOTEST 2014 (2014: Sep. 15-18, St. Louis, MO)

Department(s)

Electrical and Computer Engineering

International Standard Serial Number (ISSN)

1094-6969; 1941-0123

Document Type

Remarks

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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