Welcome to IEEE AUTOTEST 2014 [President's Perspectives]
Abstract
On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTEST 2014, being held in St. Louis, Missouri, USA, where it all started a half century ago. IEEE AUTOTEST is the focal event that brings those interested and involved in automated testing, product development, and ultimate users together under one roof. Events such as IEEE AUTOTEST are where people with the same interests and goals get together to discuss, learn, become aware of new technologies and ultimately collaborate. We are extremely happy to continue our support of IEEE AUTOTEST 2014 along with the IEEE Aerospace and Electronic Systems Society (AESS).
Recommended Citation
R. Zoughi and R. J. Lyons, "Welcome to IEEE AUTOTEST 2014 [President's Perspectives]," IEEE Instrumentation and Measurement Magazine, vol. 17, no. 4, p. 4, Institute of Electrical and Electronics Engineers (IEEE), Aug 2014.
The definitive version is available at https://doi.org/10.1109/MIM.2014.6873721
Meeting Name
IEEE AUTOTEST 2014 (2014: Sep. 15-18, St. Louis, MO)
Department(s)
Electrical and Computer Engineering
International Standard Serial Number (ISSN)
1094-6969; 1941-0123
Document Type
Remarks
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2014
