Sensitivity Analysis of Wiener Filter-Based Synthetic Aperture Radar (SAR) Microwave Imaging Technique

Abstract

Previously, a Wiener filter-based synthetic aperture radar (SAR) technique was developed to successfully image embedded objects in a general layered structure. The results of the imaging technique were then verified through performing extensive measurements. Here, the sensitivity of this technique to different critical parameters is investigated using a full-wave electromagnetic simulation software. These parameters include those related to the sample being imaged (e.g., electrical properties of layers), those related to measurements (e.g., electromagnetic wave polarization), and those associated with the modeling process (e.g., electrical properties of layers used in the image reconstruction procedure).

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development (2014: May 12-15, Montevideo, Uruguay)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Image Reconstruction; Imaging Systems; Planning; Sensitivity Analysis; Structural Health Monitoring; Sustainable Development; Embedded Object; Filter-Based; Full-Wave Electromagnetic Simulation; Layered Structures; Microwave Imaging; Modeling Process; Reconstruction Procedure; Synthetic Aperture Radar

International Standard Book Number (ISBN)

978-1467363853

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2014

Link to Full Text

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