Title

Editor-in-Chief's Note: I²MTC 2008 Special Issue

Abstract

The 62 papers in this special issue are extended versions of papers presented at the 2008 International Instrumentation and Measurement Technology Conference, held in Victoria, BC, Canada, from May 12 to 15.

It gives me great pleasure to introduce you to the Special Issue on the 2008 International Instrumentation and Measurement Technology Conference (I2MTC 2008). I2MTC 2008 was held in beautiful Victoria, Vancouver Island, BC, Canada, from May 12 to 15. As it has been customary for many years, authors who presented their papers at the conference were also invited to submit a technically extended version of their conference proceeding paper for possible publication in this Special Issue. These submissions are subjected to specific guidelines before they can be considere.

Meeting Name

2008 International Instrumentation and Measurement Technology Conference (2008: May 12-15, Victoria, BC, Canada)

Department(s)

Electrical and Computer Engineering

International Standard Serial Number (ISSN)

0018-9456; 1557-9662

Document Type

Remarks

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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