Title

On-Chip Sensors to Measure Level of Transient Events

Abstract

On-die circuits were developed to measure the size of transient electrical events experienced at I/O pads. The circuits allow an integrated circuit (IC) to determine the peak voltages across the electrostatic discharge diodes during the event. Experiments and simulations with a 90 nm test chip show the sensor can determine the peak magnitude of the transient event within 1 A for events larger than 0.7 A and duration longer than 1 ns.

Meeting Name

39th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD (2017: Sep. 10-14, Tucson, AZ)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Voltage Measurement; Electrostatic Discharges; Transient Analysis; Integrated Circuit Modeling; Capacitors; Detectors

International Standard Book Number (ISBN)

978-1-58537-293-5

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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