Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer
A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.
J. Kim et al., "Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer," Proceedings of DesignCon 2013 (2013, Santa Clara, CA), vol. 2, pp. 1052-1071, UBM Electronics, Jan 2013.
DesignCon 2013: Where Chipheads Connect (2013: Jan. 28-31, Santa Clara, CA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Piecewise Linear Techniques
International Standard Book Number (ISBN)
Article - Conference proceedings
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