Title

Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer

Abstract

A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.

Meeting Name

DesignCon 2013: Where Chipheads Connect (2013: Jan. 28-31, Santa Clara, CA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Piecewise Linear Techniques

International Standard Book Number (ISBN)

978-162748472-5

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2013 UBM Electronics, All rights reserved.

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